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Nanometrics 7200-030839-R 300mm Wafer Thickness Analyzer Inspection Stage Spare Configured for WAS DRIVER

SKU: 27242506256
4.8
EUR3252.62 EUR3273.62

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Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Oct 7 - Oct 12

Description

Configured for WAS DRIVER

Removed from a Nikon NSR-S620D ArF Immersion Scanner System This Nikon 4K957-144 Optical Block is used working surplus

Made in the USA This MDC Vacuum Products 313029 Pneumatic Angle Valve is used working surplus

Estimated Packed Shipping Dimensions: L x W x H = 22” x 12” x 14” @ 33 lbs

Model No: ES/ALS Interface This Varian VSEA E-109061001 ES/ALS Interface PCB Assembly is used working surplus

Nanometrics 7200-030839-R 300mm Wafer Thickness Analyzer Inspection Stage Spare Configured for WAS DRIVERNanometrics 7200 030839 R 300mm Wafer Thickness Analyzer Inspection Stage Spare Part No: 7200 030839 R DPWIN: 8. 33 FE 8. 27 Untested As Is This item is untested surplus and is being sold as is. The physical condition is good and there are visible signs of previous use and handling. Sale Details Item Condition: Untested Surplus, Sold As Is Estimated Packed Shipping Dimensions: L x W x H = 27"x24"x24" @ 165 lbs.; Requires Freight Shipping Shipping

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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