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JEOL Column Pneumatic Sample Gate JWS-7555S Wafer Defect Review SEM Working Sales tax will be added

SKU: 94026933762
4.6
USD505.60 USD555.60

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Ships within 48 hours · Estimated delivery Oct 9 - Oct 14

Description

Sales tax will be added to all purchases in NEW MEXICO

There is minor exposing metal near outside edge of shutter area

Part No: 2947293-01

This Ultratech Stepper 03-15-02066 6-Axis Laser Transition XP-Axis PCB Card 4700 is used working surplus

Part No: 70002862

JEOL Column Pneumatic Sample Gate JWS-7555S Wafer Defect Review SEM Working Sales tax will be addedJEOL Column Pneumatic Sample Gate JWS 7555S Wafer Defect Review SEM Working Inventory # CONF 1329 Part No: Pneumatic Sample Gate Removed from a JEOL JWS 7555S Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Pneumatic Sample Gate JWS 7555S Wafer Defect Review SEM Working is used working surplus. Removed from a JEOL JWS 7555S Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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